Date:2021-06-30 | Unsubscribe
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IEEE Xplore Digital Library - IEEE

We invite you to attend a free live webinar, which will provide authors with best practices in preparing a manuscript, navigating the journal submission process, and important tips to help an author get published. It will also review the opportunities authors have to enhance the visibility and impact of their research by publishing in the many open access options available from IEEE.

This session will feature the perspective of distinguished author, professor, and IEEE Access Editor-in-Chief Derek Abbott, who will provide critical insights on IEEE’s peer review and submission processes and provide tips on what editors look for in submissions. In addition, presenters from IEEE will cover topics such as IEEE open access programs for institutions, research strategies using IEEE Xplore, author tools from IEEE, and other important resources for authors.

Topics to Be Covered:

  • How to increase the visibility and impact of your research
  • Tips and best practices to improve an author’s chances of getting published
  • What editors and reviewers look for in submissions
  • Common reasons why papers are rejected
  • Selecting the right publication for your research submission
  • Reasons to consider an open access journal for your submission
  • Open access options available from IEEE for authors and institutions
  • Research strategies using IEEE Xplore Digital Library
  • Authorship tools available from IEEE for promoting open science
  • Live Q&A: Ask the experts for publishing tips
Event Details:
Title: IEEE Authorship and Open Access Symposium: Best Practices to Get Published to Increase the Exposure and Impact of Your Research

Date: Thursday, 8 July 2021

Time: 11:30 a.m.  

Duration: 1 hour and 30 minutes (75 minutes presentation, 15 minutes live Q&A)

Speakers:
Dr. Derek Abbott
IEEE Access Editor-in-Chief
Professor at University of Adelaide, Australia
Alex Liu Yupeng
Client Services Manager, Asia
IEEE
Ira Tan
Regional Sales Manager for APAC
IEEE
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