
IEEE
	Search Result: About 1507 results.
Breadcrumb
- Home
 - Industry standards
 - Search Result
 
- 【Organization】IEEE
 - 【Document #】IEEE N42.17C
 American National Standard Performance Specifications for Health Physics Instrumentation - Portable Instrumentation for Use in Extreme Environmental Conditions
- 【Date】1989/9/7
 - 【Reaffirmed Date】(R 2005)
 - 【Language】English
 - 【Status】Active
 
- 【Organization】IEEE
 - 【Document #】IEEE 120
 Master Test Guide for Electrical Measurements in Power Circuits
- 【Date】1989/5/22
 - 【Reaffirmed Date】(R 2007)
 - 【Language】English
 - 【Status】Active
 
- 【Organization】IEEE
 - 【Document #】IEEE C57.111
 Guide for Acceptance of Silicone Insulating Fluid and Its Maintenance in Transformers
- 【Date】1989/2/2
 - 【Reaffirmed Date】(R 2009)
 - 【Language】English
 - 【Status】Active
 
- 【Organization】IEEE
 - 【Document #】IEEE C62.92
 Guide for the Application of Neutral Grounding in Electrical Utility Systems Part II-Grounding of Synchronous Generator Systems
- 【Date】1989/2/1
 - 【Language】English
 - 【Status】Active
 
- 【Organization】IEEE
 - 【Document #】IEEE 935
 Guide on Terminology for Tools and Equipment to Be Used in Live Line Working
- 【Date】1989/1/3
 - 【Reaffirmed Date】(R 2011)
 - 【Language】English
 - 【Status】Active
 
- 【Organization】IEEE
 - 【Document #】IEEE 301
 Standard Test Procedures for Amplifiers and Preamplifiers Used with Detectors of Ionizing Radiation
- 【Date】1988/10/20
 - 【Reaffirmed Date】(R 2006)
 - 【Language】English
 - 【Status】Active
 
- 【Organization】IEEE
 - 【Document #】IEEE 813
 Format Guide and Test Procedure for Two-Degree-of-Freedom Dynamically Tuned Gyros
- 【Date】1988/8/17
 - 【Reaffirmed Date】(R 2005)
 - 【Language】English
 - 【Status】Active
 
- 【Organization】IEEE
 - 【Document #】IEEE 139
 Recommended Practice for the Measurement of Radio Frequency Emission from Industrial, Scientific, and Medical (ISM) Equipment Installed on User's Premises
- 【Date】1988/6/9
 - 【Reaffirmed Date】(R 2012)
 - 【Language】English
 - 【Status】Active
 
- 【Organization】IEEE
 - 【Document #】IEEE 300
 Standard Test Procedures for Semiconductor Charged-Particle Detectors
- 【Date】1988/6/9
 - 【Reaffirmed Date】(R 2006)
 - 【Language】English
 - 【Status】Active
 
- 【Organization】IEEE
 - 【Document #】IEEE 101
 Guide for the Statistical Analysis of Thermal Life Test Data
- 【Date】1987/9/10
 - 【Reaffirmed Date】(R 2010)
 - 【Language】English
 - 【Status】Active
 





