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Organization / Document #
IEEE
Search Result: About 1507 results.

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  • 【Organization】IEEE
  • 【Document #】IEEE N42.17C
  • American National Standard Performance Specifications for Health Physics Instrumentation - Portable Instrumentation for Use in Extreme Environmental Conditions

  • 【Date】1989/9/7
  • 【Reaffirmed Date】(R 2005)
  • 【Language】English
  • 【Status】Active
  • 【Organization】IEEE
  • 【Document #】IEEE 120
  • Master Test Guide for Electrical Measurements in Power Circuits

  • 【Date】1989/5/22
  • 【Reaffirmed Date】(R 2007)
  • 【Language】English
  • 【Status】Active
  • 【Organization】IEEE
  • 【Document #】IEEE C57.111
  • Guide for Acceptance of Silicone Insulating Fluid and Its Maintenance in Transformers

  • 【Date】1989/2/2
  • 【Reaffirmed Date】(R 2009)
  • 【Language】English
  • 【Status】Active
  • 【Organization】IEEE
  • 【Document #】IEEE C62.92
  • Guide for the Application of Neutral Grounding in Electrical Utility Systems Part II-Grounding of Synchronous Generator Systems

  • 【Date】1989/2/1
  • 【Language】English
  • 【Status】Active
  • 【Organization】IEEE
  • 【Document #】IEEE 935
  • Guide on Terminology for Tools and Equipment to Be Used in Live Line Working

  • 【Date】1989/1/3
  • 【Reaffirmed Date】(R 2011)
  • 【Language】English
  • 【Status】Active
  • 【Organization】IEEE
  • 【Document #】IEEE 301
  • Standard Test Procedures for Amplifiers and Preamplifiers Used with Detectors of Ionizing Radiation

  • 【Date】1988/10/20
  • 【Reaffirmed Date】(R 2006)
  • 【Language】English
  • 【Status】Active
  • 【Organization】IEEE
  • 【Document #】IEEE 813
  • Format Guide and Test Procedure for Two-Degree-of-Freedom Dynamically Tuned Gyros

  • 【Date】1988/8/17
  • 【Reaffirmed Date】(R 2005)
  • 【Language】English
  • 【Status】Active
  • 【Organization】IEEE
  • 【Document #】IEEE 139
  • Recommended Practice for the Measurement of Radio Frequency Emission from Industrial, Scientific, and Medical (ISM) Equipment Installed on User's Premises

  • 【Date】1988/6/9
  • 【Reaffirmed Date】(R 2012)
  • 【Language】English
  • 【Status】Active
  • 【Organization】IEEE
  • 【Document #】IEEE 300
  • Standard Test Procedures for Semiconductor Charged-Particle Detectors

  • 【Date】1988/6/9
  • 【Reaffirmed Date】(R 2006)
  • 【Language】English
  • 【Status】Active
  • 【Organization】IEEE
  • 【Document #】IEEE 101
  • Guide for the Statistical Analysis of Thermal Life Test Data

  • 【Date】1987/9/10
  • 【Reaffirmed Date】(R 2010)
  • 【Language】English
  • 【Status】Active