
IEC
搜尋結果:找到 7216 筆資料
- 【組 織】IEC
- 【文件編號】IEC 62401
Radiation protection instrumentation – Alarming personal radiation devices (PRDs) for the detection of illicit trafficking of radioactive material - Edition 2.0
- 【日 期】2017/12/1
- 【語 言】English; French
- 【狀 態】Active
- 【組 織】IEC
- 【文件編號】IEC 62327
Radiation protection instrumentation - Hand-held instruments for the detection and identification of radionuclides and for the estimation of ambient dose equivalent rate from photon radiation - Edition 2.0
- 【日 期】2017/12/1
- 【語 言】English
- 【狀 態】Active
- 【組 織】IEC
- 【文件編號】IEC 62928
Railway applications – Rolling stock – Onboard lithium-ion traction batteries - Edition 1.0
- 【日 期】2017/12/1
- 【語 言】English; French
- 【狀 態】Active
- 【組 織】IEC
- 【文件編號】IEC 63024
Requirements for automatic reclosing devices (ARDs) for circuit-breakers, RCBOs and RCCBs for household and similar uses - Edition 1.0
- 【日 期】2017/12/1
- 【語 言】English; French
- 【狀 態】Active
- 【組 織】IEC
- 【文件編號】IEC 60034-27-1
Rotating electrical machines – Part 27-1: Off-line partial discharge measurements on the winding insulation - Edition 1.0
- 【日 期】2017/12/1
- 【語 言】English; French
- 【狀 態】Active
- 【組 織】IEC
- 【文件編號】IEC 60825-1 INT 2
Safety of laser products – Part 1: Equipment classification and requirements - Edition 3.0
- 【日 期】2017/12/1
- 【語 言】English; French
- 【狀 態】Active
- 【組 織】IEC
- 【文件編號】IEC 60825-1 INT 1
Safety of laser products – Part 1: Equipment classification and requirements - Edition 3.0
- 【日 期】2017/12/1
- 【語 言】English; French
- 【狀 態】Active
- 【組 織】IEC
- 【文件編號】IEC 60749-12
Semiconductor devices – Mechanical and climatic test methods – Part 12: Vibration, variable frequency - Edition 2.0
- 【日 期】2017/12/1
- 【語 言】English; French
- 【狀 態】Active
- 【組 織】IEC
- 【文件編號】IEC 62969-1
Semiconductor devices – Semiconductor interface for automotive vehicles – Part 1: General requirements of power interface for automotive vehicle sensors - Edition 1.0
- 【日 期】2017/12/1
- 【語 言】English
- 【狀 態】Active
- 【組 織】IEC
- 【文件編號】IEC 60674-2 CORR 1
SPECIFICATION FOR PLASTIC FILMS FOR ELECTRICAL PURPOSES – Part 2: Methods of test - Edition 2.0
- 【日 期】2017/12/1
- 【語 言】English
- 【狀 態】Active