IEC
搜尋結果：找到 7216 筆資料
- 【組 織】IEC
- 【文件編號】IEC 62979
Photovoltaic modules – Bypass diode – Thermal runaway test - Edition 1.0
- 【日 期】2017/8/1
- 【語 言】English
- 【狀 態】Active
- 【組 織】IEC
- 【文件編號】IEC 62899-301-2
Printed electronics – Part 301-2: Equipment – Contact printing – Rigid master – Measurement method of plate master pattern dimension - Edition 1.0
- 【日 期】2017/8/1
- 【語 言】English
- 【狀 態】Active
- 【組 織】IEC
- 【文件編號】IEC 62899-302-1
Printed electronics – Part 302-1: Equipment – Inkjet – Imaging based measurement of jetting speed - Edition 1.0
- 【日 期】2017/8/1
- 【語 言】English
- 【狀 態】Active
- 【組 織】IEC
- 【文件編號】IEC 61169-58 CORR 1
Radio-frequency connectors - Part 58: Sectional specification for RF coaxial connectors with blind-mate coupling - Characteristic impedance 50 Ω (type SBMA) - Edition 1.0
- 【日 期】2017/8/1
- 【語 言】English; French
- 【狀 態】Active
- 【組 織】IEC
- 【文件編號】IEC 62486
Railway applications – Current collection systems – Technical criteria for the interaction between pantograph and overhead contactline (to achieve free access) - Edition 2.0
- 【日 期】2017/8/1
- 【語 言】English; French
- 【狀 態】Active
- 【組 織】IEC
- 【文件編號】IEC PAS 62257-10
Recommendations for renewable energy and hybrid systems for rural electrification – Part 10: Silicon solar module visual inspection guide - Edition 1.0
- 【日 期】2017/8/1
- 【語 言】English
- 【狀 態】Active
- 【組 織】IEC
- 【文件編號】IEC 62443-2-4
Security for industrial automation and control systems – Part 2-4: Security program requirements for IACS service providers - Edition 1.1; Consolidated Reprint
- 【日 期】2017/8/1
- 【語 言】English
- 【狀 態】Active
- 【組 織】IEC
- 【文件編號】IEC 60747-16-3
Semiconductor devices – Part 16-3: Microwave integrated circuits – Frequency converters - Edition 1.2; Consolidated Reprint
- 【日 期】2017/8/1
- 【語 言】English
- 【狀 態】Active
- 【組 織】IEC
- 【文件編號】IEC 60747-16-4
Semiconductor devices – Part 16-4: Microwave integrated circuits – Switches - Edition 1.2; Consolidated Reprint
- 【日 期】2017/8/1
- 【語 言】English
- 【狀 態】Active
- 【組 織】IEC
- 【文件編號】IEC 62880-1
Semiconductor devices – Stress migration test standard – Part 1: Copper stress migration test standard - Edition 1.0
- 【日 期】2017/8/1
- 【語 言】English
- 【狀 態】Active
