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- 【Organization】IEEE
- 【Document #】IEEE 2600.4
Protection Profile for Hardcopy Devices in IEEE Std 2600-2008 Operational Environment D - IEEE Computer Society
- 【Date】2010/2/1
- 【Language】English
- 【Status】Active
- 【Organization】IEEE
- 【Document #】IEEE C95.1A
Safety Levels with Respect to Human Exposure to Radio Frequency Electromagnetic Fields, 3 kHz to 300 GHz Amendment 1: Specifies Ceiling Limits for Induced and Contact Current, Clarifies Distinctions between Localized Exposure and Spatial Peak Power Densit
- 【Date】2010/2/1
- 【Language】English
- 【Status】Active
- 【Organization】IEEE
- 【Document #】IEEE 115
Guide for Test Procedures for Synchronous Machines Part I-Acceptance and Performance Testing Part II-Test Procedures and Parameter Determination for Dynamic Analysis
- 【Date】2009/12/1
- 【Language】English
- 【Status】Active
- 【Organization】IEEE
- 【Document #】IEEE 1142
Guide for the Selection, Testing, Application, and Installation of Cables having Radial-Moisture Barriers and/or Longitudianal Water Blocking
- 【Date】2009/12/1
- 【Language】English
- 【Status】Active
- 【Organization】IEEE
- 【Document #】IEEE 1680
IEEE Standard for Environmental Assessment of Electronic Products - IEEE Computer Society
- 【Date】2009/12/1
- 【Language】English
- 【Status】Active
- 【Organization】IEEE
- 【Document #】IEEE 1481
Integrated Circuit (IC) Open Library Architecture (OLA) - IEEE Computer Society
- 【Date】2009/12/1
- 【Language】English
- 【Status】Active
- 【Organization】IEEE
- 【Document #】IEEE 2600.2
Protection Profile for Hardcopy Devices in IEEE Std 2600-2008 Operational Environment B - IEEE Computer Society
- 【Date】2009/12/1
- 【Language】English
- 【Status】Active
- 【Organization】IEEE
- 【Document #】IEEE 2600.3
Protection Profile for Hardcopy Devices in IEEE Std 2600-2008 Operational Environment C - IEEE Computer Society
- 【Date】2009/12/1
- 【Language】English
- 【Status】Active
- 【Organization】IEEE
- 【Document #】IEEE 433
Recommended Practice for Insulation Testing of AC Electric Machinery with High Voltage at Very Low Frequency
- 【Date】2009/12/1
- 【Language】English
- 【Status】Active
- 【Organization】IEEE
- 【Document #】IEEE 1149.7
Reduced-Pin and Enhanced-Functionality Test Access Port and Boundary-Scan Architecture - IEEE Computer Society
- 【Date】2009/12/1
- 【Language】English
- 【Status】Active