IEEE
Search Result: About 1507 results.
Breadcrumb
- Home
- Industry standards
- Search Result
- 【Organization】IEEE
- 【Document #】IEEE 1613
Environmental and Testing Requirements for Communications Networking Devices Installed in Electric Power Substations
- 【Date】2009/6/1
- 【Language】English
- 【Status】Active
- 【Organization】IEEE
- 【Document #】IEEE 1783
Guide for Test Methods and Procedures to Evaluate the Electrical Performance of Insulators in Freezing Conditions
- 【Date】2009/6/1
- 【Language】English
- 【Status】Active
- 【Organization】IEEE
- 【Document #】IEEE 1559
Inertial Systems Terminology
- 【Date】2009/6/1
- 【Language】English
- 【Status】Active
- 【Organization】IEEE
- 【Document #】IEEE C37.04 CORR 1
Rating Structure for AC High-Voltage Circuit Breakers Corrigendum 1
- 【Date】2009/6/1
- 【Language】English
- 【Status】Active
- 【Organization】IEEE
- 【Document #】IEEE 1628
Recommended Practice for Maintenance of DC Overhead Contact Systems for Transit Systems
- 【Date】2009/6/1
- 【Language】English
- 【Status】Active
- 【Organization】IEEE
- 【Document #】IEEE 836
Recommended Practice for Precision Centrifuge Testing of Linear Accelerometers
- 【Date】2009/6/1
- 【Language】English
- 【Status】Active
- 【Organization】IEEE
- 【Document #】IEEE 48
Test Procedures and Requirements for Alternating-Current Cable Terminations Used on Shielded Cables Having Laminated Insulation Rated 2.5 kV through 765 kV or Extruded Insulation Rated 2.5 kV through 500 kV
- 【Date】2009/6/1
- 【Language】English
- 【Status】Active
- 【Organization】IEEE
- 【Document #】IEEE 2600.1
A Protection Profile in Operational Environment A - IEEE Computer Society
- 【Date】2009/5/1
- 【Language】English
- 【Status】Active
- 【Organization】IEEE
- 【Document #】IEEE 1450.6.1
Describing On-Chip Scan Compression - IEEE Computer Society
- 【Date】2009/5/1
- 【Language】English
- 【Status】Active
- 【Organization】IEEE
- 【Document #】IEEE 516
Guide for Maintenance Methods on Energized Power Lines
- 【Date】2009/5/1
- 【Language】English
- 【Status】Active